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Authors: Andreas Krinke, Tilman Horst, Georg Glaser, Martin Grabmann, Tobias Markus, Benjamin Prautsch, Uwe Hatnik, Jens Lienig
Journal title: 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-10
DOI identifier: 10.1109/ddecs.2019.8724669
ISBN:978-1-7281-0073-9