Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing

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Authors: Mohammed Al-kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal and Jacques Pinaton

Journal publisher: IEEE

Published year: 2019

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Electronics and ICT as enabler for digital industry and optimized supply chain management covering the entire product lifecycle
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