Design and validation of fault-tolerant embedded controllers

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Authors: Saurav Kumar Ghosh, Soumyajjit Dey, Dip Goswami, Daniel Mueller-Gritschneder, Samarjit Chakraborty

Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2018

Published pages: 1283-1288

DOI identifier: 10.23919/date.2018.8342212

ISBN:978-3-9819263-0-9