Utilizing uncertainty information in remaining useful life estimation via Bayesian neural networks and Hamiltonian Monte Carlo

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Authors: Maximilian Benker, Lukas Furtner, Thomas Semm, Michael F. Zaeh

Journal title: Journal of Manufacturing Systems

Journal publisher: Elsevier BV

Published year: 2020

DOI identifier: 10.1016/j.jmsy.2020.11.005

ISSN:0278-6125