D7.6: D7.2.2.1 Yield estimation and prediction figures of merit and yield detracting factors’ determination

Summary
The deliverable reports advanced methods for multifactor pre- and post-silicon yield estimation and prediction, detection of yield detractors and root cause discovery.
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Web resources: https://ec.europa.eu/research/participants/documents/downloadPublic?documentIds=080166e5d21a78c9&appId=PPGMS
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