Multi-tenant Data Management in Collaborative Zero Defect Manufacturing

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Francisco Fraile, Leticia Montalvillo, Maria Angeles Rodriguez, Hector Navarro, Angel Ortiz

Journal title: 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)

Journal publisher: IEEE

Published year: 2021

Published pages: 464-468

DOI identifier: 10.1109/metroind4.0iot51437.2021.9488534

ISBN:978-1-6654-1980-2

Results type(s)
Unfold all
/
Fold all
Report - Video - Presentation - Publication....?
Structured mapping
Unfold all
/
Fold all