Multi-tenant Data Management in Collaborative Zero Defect Manufacturing

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Authors: Francisco Fraile, Leticia Montalvillo, Maria Angeles Rodriguez, Hector Navarro, Angel Ortiz

Journal title: 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)

Journal publisher: IEEE

Published year: 2021

Published pages: 464-468

DOI identifier: 10.1109/metroind4.0iot51437.2021.9488534

ISBN:978-1-6654-1980-2

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