EFFRA Innovation Portal

Machine Learning for Network-based Intrusion Detection in Industry 4.0

Project: SEMI40

Updated at: 29-04-2024

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Easy Sensor integration in industrial environments

Project: SEMI40

Updated at: 29-04-2024

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Systemdynamik-Ansätze zur Optimierung der PPS

Project: SEMI40

Updated at: 29-04-2024

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Machine Learning algorithms for advanced process control in the semiconductor industry

Project: SEMI40

Updated at: 29-04-2024

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Semiconductor Research Roadmap

Project: SEMI40

Updated at: 29-04-2024

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An Information-Theoretic Measure for Pattern Similarity in Analog Wafermaps

Project: SEMI40

Updated at: 29-04-2024

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Interactive Stack Wafer Map with Feature Selection Capabilities

Project: SEMI40

Updated at: 29-04-2024

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Photoresist Dispense Detection

Project: SEMI40

Updated at: 29-04-2024

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An Investigation of Statistical Measures for Intensity Comparison of Process Patterns in Analog Wafer Test Data

Project: SEMI40

Updated at: 29-04-2024

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Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Model

Project: SEMI40

Updated at: 29-04-2024

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A Scalable Wafer Dispatching Strategy Based on Dynamic Programming

Project: SEMI40

Updated at: 29-04-2024

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Robustness against Covariate Shift of Water Chiller Models for Optimal Energy Management in a SM plant

Project: SEMI40

Updated at: 29-04-2024

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Application of the CPPS meta-model for implementation of Industrie 4.0 Administration Shells

Project: SEMI40

Updated at: 29-04-2024

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Self-Adaptation Applied to MQTT via GAMF

Project: SEMI40

Updated at: 29-04-2024

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Design and Implementation of IIoT Demonstrators using Hardware Security Extensions

Project: SEMI40

Updated at: 29-04-2024

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You want to close the gap between exploding amounts of data, while enabling the rise of your globalized real time enterp...

Project: SEMI40

Updated at: 29-04-2024

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The impact of digital technologies on manufacturing performance: A simulation modelling approach

Project: SEMI40

Updated at: 29-04-2024

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Machine Learning and Automated Decision Making

Project: SEMI40

Updated at: 29-04-2024

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Networking the APC-Systems into a Fab Software Landscape

Project: SEMI40

Updated at: 29-04-2024

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Die große Wirkung der kleinsten Teile

Project: SEMI40

Updated at: 29-04-2024

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Automated-generated long term Simulation model in semiconductor manufacturing

Project: SEMI40

Updated at: 29-04-2024

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Automated Framework to Influence Production Dispatch Based on Supply Chain Events

Project: SEMI40

Updated at: 29-04-2024

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A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs

Project: SEMI40

Updated at: 29-04-2024

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MES Challenges

Project: SEMI40

Updated at: 29-04-2024

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Continuous Compliance in Cyber Physical Systems

Project: SEMI40

Updated at: 29-04-2024

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An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry

Project: SEMI40

Updated at: 29-04-2024

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Detection of adhesive film residues during wafer demounting

Project: SEMI40

Updated at: 29-04-2024

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Generic on-line video anomaly detection for cmp wafer cleaning

Project: SEMI40

Updated at: 29-04-2024

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Key elements of productivity enhancement in semiconductor manufacturing usig digitalization and fab simulation

Project: SEMI40

Updated at: 29-04-2024

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Video-Supported real-time analysis of products and manufacturing processes

Project: SEMI40

Updated at: 29-04-2024

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Resources

Selected filters:

Machine Learning for Network-based Intrusion Detection in Industry 4.0

Easy Sensor integration in industrial environments

Systemdynamik-Ansätze zur Optimierung der PPS

Machine Learning algorithms for advanced process control in the semiconductor industry

Semiconductor Research Roadmap

An Information-Theoretic Measure for Pattern Similarity in Analog Wafermaps

Interactive Stack Wafer Map with Feature Selection Capabilities

Photoresist Dispense Detection

An Investigation of Statistical Measures for Intensity Comparison of Process Patterns in Analog Wafer Test Data

Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Model

A Scalable Wafer Dispatching Strategy Based on Dynamic Programming

Robustness against Covariate Shift of Water Chiller Models for Optimal Energy Management in a SM plant

Application of the CPPS meta-model for implementation of Industrie 4.0 Administration Shells

Self-Adaptation Applied to MQTT via GAMF

Design and Implementation of IIoT Demonstrators using Hardware Security Extensions

You want to close the gap between exploding amounts of data, while enabling the rise of your globalized real time enterp...

The impact of digital technologies on manufacturing performance: A simulation modelling approach

Machine Learning and Automated Decision Making

Networking the APC-Systems into a Fab Software Landscape

Die große Wirkung der kleinsten Teile

Automated-generated long term Simulation model in semiconductor manufacturing

Automated Framework to Influence Production Dispatch Based on Supply Chain Events

A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs

MES Challenges

Continuous Compliance in Cyber Physical Systems

An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry

Detection of adhesive film residues during wafer demounting

Generic on-line video anomaly detection for cmp wafer cleaning

Key elements of productivity enhancement in semiconductor manufacturing usig digitalization and fab simulation

Video-Supported real-time analysis of products and manufacturing processes