EFFRA Innovation Portal

Application Study of Hardware-Based Security for Future Industrial IOT

Project: SEMI40

Updated at: 29-04-2024

SemI40 - Simulationsmodelle in der Halbleiterindustrie: Modellierung so detailliert wie nötig und so einfach wie mögli...

Project: SEMI40

Updated at: 29-04-2024

Transfer of Run-to-Run-Control to Production Control Level in Semiconductor Front-End

Project: SEMI40

Updated at: 29-04-2024

An impact evaluation approach for smart factory cases

Project: SEMI40

Updated at: 29-04-2024

On-the-fly camera software solution for automatic perspective recognition of structured surfaces

Project: SEMI40

Updated at: 29-04-2024

Identification of the Gordon-Ng Chiller Model: Linear to Nonlinear Least Squares?

Project: SEMI40

Updated at: 29-04-2024

Job-shop scheduling with optimal inclusion of work-free night shifts

Project: SEMI40

Updated at: 29-04-2024

Secured Action Authorization for Industrial Mobile Robots

Project: SEMI40

Updated at: 29-04-2024

Physics and chemistry behind plasma chamber conditioning for predictive maintenance

Project: SEMI40

Updated at: 29-04-2024

The granularity of the automated-generated long-term simulation model

Project: SEMI40

Updated at: 29-04-2024

An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry

Project: SEMI40

Updated at: 29-04-2024

Case Study on Operator Compliance to Scheduling Decisions in Semiconductor Manufacturing

Project: SEMI40

Updated at: 29-04-2024

Cybersecurity Attacks in Semiconductor Supply Chain Environment

Project: SEMI40

Updated at: 29-04-2024

Data Science along the semiconductor frontend production

Project: SEMI40

Updated at: 29-04-2024

Digitalization to Assure Quality Targets within the Semiconductor Industry

Project: SEMI40

Updated at: 29-04-2024

Bestimmung von Objektparametern aus industriellen Bildern mit neuronalen Netzwerken

Project: SEMI40

Updated at: 29-04-2024

Continuous Security Compliance Verification in Industry 4.0

Project: SEMI40

Updated at: 29-04-2024

Security Compliance Verification in Cyber Physical Systems

Project: SEMI40

Updated at: 29-04-2024

Product health assessment using patterns in semiconductor wafer test data

Project: SEMI40

Updated at: 29-04-2024

Deep Reinforcement Learning for Semiconductor Production Scheduling

Project: SEMI40

Updated at: 29-04-2024

Estimating wafer chuck angular velocity from video data

Project: SEMI40

Updated at: 29-04-2024

Towards Applying the Virtual Director Concept to 360 Degree Video Content

Project: SEMI40

Updated at: 29-04-2024

Lead time prediction using machine learning algorithms: A case study by a semiconductor manufacturer

Project: SEMI40

Updated at: 29-04-2024

Optimization of global production scheduling with deep reinforcement learning

Project: SEMI40

Updated at: 29-04-2024

Stochastic Optimal Power Flow in islanded grids with renewable penetration, energy storage systems and possible curtailm...

Project: SEMI40

Updated at: 29-04-2024

Machine Learning to Automate Network Segregation for Enhanced Secuirty in Industry 4.0

Project: SEMI40

Updated at: 29-04-2024

A new approach using characteristic video singals to improve the stability of manufacturing processes

Project: SEMI40

Updated at: 29-04-2024

Enabling Security and Safety Evaluation in Industry 4.0 Use cases with Digital Twins

Project: SEMI40

Updated at: 29-04-2024

Statistische Prozesskontrolle als Entscheidungshilfe und Kontrollmethode für die Produktionsprogrammplanung in der Halb...

Project: SEMI40

Updated at: 29-04-2024

Towards Robust Visual Wafer Cleaning Anomaly Detection

Project: SEMI40

Updated at: 29-04-2024

Resources

Selected filters:

Application Study of Hardware-Based Security for Future Industrial IOT

SemI40 - Simulationsmodelle in der Halbleiterindustrie: Modellierung so detailliert wie nötig und so einfach wie mögli...

Transfer of Run-to-Run-Control to Production Control Level in Semiconductor Front-End

An impact evaluation approach for smart factory cases

On-the-fly camera software solution for automatic perspective recognition of structured surfaces

Identification of the Gordon-Ng Chiller Model: Linear to Nonlinear Least Squares?

Job-shop scheduling with optimal inclusion of work-free night shifts

Secured Action Authorization for Industrial Mobile Robots

Physics and chemistry behind plasma chamber conditioning for predictive maintenance

The granularity of the automated-generated long-term simulation model

An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry

Case Study on Operator Compliance to Scheduling Decisions in Semiconductor Manufacturing

Cybersecurity Attacks in Semiconductor Supply Chain Environment

Data Science along the semiconductor frontend production

Digitalization to Assure Quality Targets within the Semiconductor Industry

Bestimmung von Objektparametern aus industriellen Bildern mit neuronalen Netzwerken

Continuous Security Compliance Verification in Industry 4.0

Security Compliance Verification in Cyber Physical Systems

Product health assessment using patterns in semiconductor wafer test data

Deep Reinforcement Learning for Semiconductor Production Scheduling

Estimating wafer chuck angular velocity from video data

Towards Applying the Virtual Director Concept to 360 Degree Video Content

Lead time prediction using machine learning algorithms: A case study by a semiconductor manufacturer

Optimization of global production scheduling with deep reinforcement learning

Stochastic Optimal Power Flow in islanded grids with renewable penetration, energy storage systems and possible curtailm...

Machine Learning to Automate Network Segregation for Enhanced Secuirty in Industry 4.0

A new approach using characteristic video singals to improve the stability of manufacturing processes

Enabling Security and Safety Evaluation in Industry 4.0 Use cases with Digital Twins

Statistische Prozesskontrolle als Entscheidungshilfe und Kontrollmethode für die Produktionsprogrammplanung in der Halb...

Towards Robust Visual Wafer Cleaning Anomaly Detection