EFFRA Innovation Portal

Photoresist Dispense Detection

Project: SEMI40

Updated at: 29-04-2024

An Information-Theoretic Measure for Pattern Similarity in Analog Wafermaps

Project: SEMI40

Updated at: 29-04-2024

Machine Learning algorithms for advanced process control in the semiconductor industry

Project: SEMI40

Updated at: 29-04-2024

Capturing Industry 4.0 Use Cases for interdisciplinary implementation teams

Project: SEMI40

Updated at: 29-04-2024

Systemdynamik-Ansätze zur Optimierung der PPS

Project: SEMI40

Updated at: 29-04-2024

Interactive Stack Wafer Map with Feature Selection Capabilities

Project: SEMI40

Updated at: 29-04-2024

Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Model

Project: SEMI40

Updated at: 29-04-2024

The impact of digital technologies on manufacturing performance: A simulation modelling approach

Project: SEMI40

Updated at: 29-04-2024

You want to close the gap between exploding amounts of data, while enabling the rise of your globalized real time enterp...

Project: SEMI40

Updated at: 29-04-2024

A Scalable Wafer Dispatching Strategy Based on Dynamic Programming

Project: SEMI40

Updated at: 29-04-2024

An Investigation of Statistical Measures for Intensity Comparison of Process Patterns in Analog Wafer Test Data

Project: SEMI40

Updated at: 29-04-2024

Application of the CPPS meta-model for implementation of Industrie 4.0 Administration Shells

Project: SEMI40

Updated at: 29-04-2024

Design and Implementation of IIoT Demonstrators using Hardware Security Extensions

Project: SEMI40

Updated at: 29-04-2024

Machine Learning and Automated Decision Making

Project: SEMI40

Updated at: 29-04-2024

Robustness against Covariate Shift of Water Chiller Models for Optimal Energy Management in a SM plant

Project: SEMI40

Updated at: 29-04-2024

Self-Adaptation Applied to MQTT via GAMF

Project: SEMI40

Updated at: 29-04-2024

Networking the APC-Systems into a Fab Software Landscape

Project: SEMI40

Updated at: 29-04-2024

Generic on-line video anomaly detection for cmp wafer cleaning

Project: SEMI40

Updated at: 29-04-2024

Knowledge Protection Practices in a Data-Centric Collaborative Research and Innovation Project

Project: SEMI40

Updated at: 29-04-2024

Video-Supported real-time analysis of products and manufacturing processes

Project: SEMI40

Updated at: 29-04-2024

MES Challenges

Project: SEMI40

Updated at: 29-04-2024

Automated-generated long term Simulation model in semiconductor manufacturing

Project: SEMI40

Updated at: 29-04-2024

Die große Wirkung der kleinsten Teile

Project: SEMI40

Updated at: 29-04-2024

Key elements of productivity enhancement in semiconductor manufacturing usig digitalization and fab simulation

Project: SEMI40

Updated at: 29-04-2024

A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs

Project: SEMI40

Updated at: 29-04-2024

Continuous Compliance in Cyber Physical Systems

Project: SEMI40

Updated at: 29-04-2024

Automated Framework to Influence Production Dispatch Based on Supply Chain Events

Project: SEMI40

Updated at: 29-04-2024

Detection of adhesive film residues during wafer demounting

Project: SEMI40

Updated at: 29-04-2024

An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry

Project: SEMI40

Updated at: 29-04-2024

Machine Learning Techniques for Automated Wafer Assessment using Wafer Test Data

Project: SEMI40

Updated at: 29-04-2024

Resources

Selected filters:

Photoresist Dispense Detection

An Information-Theoretic Measure for Pattern Similarity in Analog Wafermaps

Machine Learning algorithms for advanced process control in the semiconductor industry

Capturing Industry 4.0 Use Cases for interdisciplinary implementation teams

Systemdynamik-Ansätze zur Optimierung der PPS

Interactive Stack Wafer Map with Feature Selection Capabilities

Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Model

The impact of digital technologies on manufacturing performance: A simulation modelling approach

You want to close the gap between exploding amounts of data, while enabling the rise of your globalized real time enterp...

A Scalable Wafer Dispatching Strategy Based on Dynamic Programming

An Investigation of Statistical Measures for Intensity Comparison of Process Patterns in Analog Wafer Test Data

Application of the CPPS meta-model for implementation of Industrie 4.0 Administration Shells

Design and Implementation of IIoT Demonstrators using Hardware Security Extensions

Machine Learning and Automated Decision Making

Robustness against Covariate Shift of Water Chiller Models for Optimal Energy Management in a SM plant

Self-Adaptation Applied to MQTT via GAMF

Networking the APC-Systems into a Fab Software Landscape

Generic on-line video anomaly detection for cmp wafer cleaning

Knowledge Protection Practices in a Data-Centric Collaborative Research and Innovation Project

Video-Supported real-time analysis of products and manufacturing processes

MES Challenges

Automated-generated long term Simulation model in semiconductor manufacturing

Die große Wirkung der kleinsten Teile

Key elements of productivity enhancement in semiconductor manufacturing usig digitalization and fab simulation

A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs

Continuous Compliance in Cyber Physical Systems

Automated Framework to Influence Production Dispatch Based on Supply Chain Events

Detection of adhesive film residues during wafer demounting

An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry

Machine Learning Techniques for Automated Wafer Assessment using Wafer Test Data