EFFRA Innovation Portal

PRODUCTION PLANNING MODELS WITH PRODUCTIVITY AND FINANCIAL OBJECTIVE FUNCTIONS IN SEMICONDUCTOR MANUFACTURING

Project: Productive4.0

Updated at: 29-04-2024

Optimal Dynamic Allocation of Collaborative Servers in Two Station Tandem Systems

Project: Productive4.0

Updated at: 29-04-2024

Comparison of optimal buffer allocation in flow lines under installation buffer, echelon buffer, and CONWIP policies

Project: Productive4.0

Updated at: 29-04-2024

Quality based scheduling for an example of semiconductor manufactory

Project: Productive4.0

Updated at: 29-04-2024

Modelling and analysis of a cooperative production network

Project: Productive4.0

Updated at: 29-04-2024

Efficient RSS-Based DoA Estimation for ESPAR Antennas Using Multiplane SDR Calibration Approach

Project: Productive4.0

Updated at: 29-04-2024

Modelling and analysis of the impact of correlated inter-event data on production control using Markovian arrival proces...

Project: Productive4.0

Updated at: 29-04-2024

Enable Co-Simulation for Industrial Automation by an FMU Exporter for IEC 61499 Models

Project: Productive4.0

Updated at: 29-04-2024

Towards a Security Cost Model for Cyber-Physical Systems

Project: Productive4.0

Updated at: 29-04-2024

Accurate PPCC-Based DoA Estimation Using Multiple Calibration Planes for WSN Nodes Equipped with ESPAR Antennas

Project: Productive4.0

Updated at: 29-04-2024

Runtime Contracts Checker: Increasing Robustness of Component-Based Software Systems

Project: Productive4.0

Updated at: 29-04-2024

Enabling Security and Safety Evaluation in Industry 4.0 Use cases with Digital Twins

Project: Productive4.0

Updated at: 29-04-2024

RSS-Based DoA Estimation Using ESPAR Antenna Radiation Patterns Spline Interpolation

Project: Productive4.0

Updated at: 29-04-2024

Deep learning for virtual metrology: Modeling with optical emission spectroscopy data

Project: Productive4.0

Updated at: 29-04-2024

Anomaly detection through on-line isolation Forest: An application to plasma etching

Project: Productive4.0

Updated at: 29-04-2024

A Dynamic Sampling Approach for Cost Reduction in Semiconductor Manufacturing

Project: Productive4.0

Updated at: 29-04-2024

Anomaly Detection Approaches for Semiconductor Manufacturing

Project: Productive4.0

Updated at: 29-04-2024

A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing

Project: Productive4.0

Updated at: 29-04-2024

On Optimising Spatial Sampling Plans for Wafer Profile Reconstruction

Project: Productive4.0

Updated at: 29-04-2024

Aggregated Hierarchical Modeling and Simulation in Semiconductor Supply Chains

Project: Productive4.0

Updated at: 29-04-2024

Supporting IoT semantic interoperability with autonomic computing

Project: Productive4.0

Updated at: 29-04-2024

GENERIC DATA MODEL FOR SEMICONDUCTOR MANUFACTURING SUPPLY CHAINS

Project: Productive4.0

Updated at: 29-04-2024

A Methodology for Efficient Dynamic Spatial Sampling and Reconstruction of Wafer Profiles

Project: Productive4.0

Updated at: 29-04-2024

A dynamic sampling strategy based on confidence level of virtual metrology predictions

Project: Productive4.0

Updated at: 29-04-2024

A Review of Simulation-Optimization Methods with Applications to Semiconductor Operational Problems

Project: Productive4.0

Updated at: 29-04-2024

Final report on certification strategies

Project: Productive4.0

Updated at: 29-04-2024

AMT 2.0: Qualitative and Quantitative Trace Analysis with Extended Signal Temporal Logic

Project: Productive4.0

Updated at: 29-04-2024

Applying industrial data analytics in automotive test bed environments

Project: Productive4.0

Updated at: 29-04-2024

A Convolutional Autoencoder Approach for Feature Extraction in Virtual Metrology

Project: Productive4.0

Updated at: 29-04-2024

Interacting with the Arrowhead Local Cloud: On-boarding Procedure

Project: Productive4.0

Updated at: 29-04-2024

Resources

Selected filters:

PRODUCTION PLANNING MODELS WITH PRODUCTIVITY AND FINANCIAL OBJECTIVE FUNCTIONS IN SEMICONDUCTOR MANUFACTURING

Optimal Dynamic Allocation of Collaborative Servers in Two Station Tandem Systems

Comparison of optimal buffer allocation in flow lines under installation buffer, echelon buffer, and CONWIP policies

Quality based scheduling for an example of semiconductor manufactory

Modelling and analysis of a cooperative production network

Efficient RSS-Based DoA Estimation for ESPAR Antennas Using Multiplane SDR Calibration Approach

Modelling and analysis of the impact of correlated inter-event data on production control using Markovian arrival proces...

Enable Co-Simulation for Industrial Automation by an FMU Exporter for IEC 61499 Models

Towards a Security Cost Model for Cyber-Physical Systems

Accurate PPCC-Based DoA Estimation Using Multiple Calibration Planes for WSN Nodes Equipped with ESPAR Antennas

Runtime Contracts Checker: Increasing Robustness of Component-Based Software Systems

Enabling Security and Safety Evaluation in Industry 4.0 Use cases with Digital Twins

RSS-Based DoA Estimation Using ESPAR Antenna Radiation Patterns Spline Interpolation

Deep learning for virtual metrology: Modeling with optical emission spectroscopy data

Anomaly detection through on-line isolation Forest: An application to plasma etching

A Dynamic Sampling Approach for Cost Reduction in Semiconductor Manufacturing

Anomaly Detection Approaches for Semiconductor Manufacturing

A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing

On Optimising Spatial Sampling Plans for Wafer Profile Reconstruction

Aggregated Hierarchical Modeling and Simulation in Semiconductor Supply Chains

Supporting IoT semantic interoperability with autonomic computing

GENERIC DATA MODEL FOR SEMICONDUCTOR MANUFACTURING SUPPLY CHAINS

A Methodology for Efficient Dynamic Spatial Sampling and Reconstruction of Wafer Profiles

A dynamic sampling strategy based on confidence level of virtual metrology predictions

A Review of Simulation-Optimization Methods with Applications to Semiconductor Operational Problems

Final report on certification strategies

AMT 2.0: Qualitative and Quantitative Trace Analysis with Extended Signal Temporal Logic

Applying industrial data analytics in automotive test bed environments

A Convolutional Autoencoder Approach for Feature Extraction in Virtual Metrology

Interacting with the Arrowhead Local Cloud: On-boarding Procedure