EFFRA Innovation Portal

Presentation: A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facili...

Project: iDev40

Updated at: 29-04-2024

BEYOND SMART SYSTEMS – CREATING A SOCIETY OF THE FUTURE (5.0) RESOLVING DISRUPTIVE CHANGES AND SOCIAL CHALLENGES

Project: iDev40

Updated at: 29-04-2024

Ontology-Based Model for Automotive Security Verification and Validation

Project: iDev40

Updated at: 29-04-2024

On-Chip Power Stage and Gate Driver for Fast Switching Applications

Project: iDev40

Updated at: 29-04-2024

Presentation: Statistical Modelling and Design for Quality Control and Reliability Analysis in Power Semiconductor Manuf...

Project: iDev40

Updated at: 29-04-2024

Human Work Activity Recognition for Working Cells in Industrial Production Contexts

Project: iDev40

Updated at: 29-04-2024

Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks

Project: iDev40

Updated at: 29-04-2024

Realizing the full potential of Robotic Process Automation through a combination with BPM

Project: iDev40

Updated at: 29-04-2024

Spiking Neural Networks and online learning: an overview and perspectives

Project: iDev40

Updated at: 29-04-2024

SAZED: parameter-free domain-agnostic season length estimation in time series data

Project: iDev40

Updated at: 29-04-2024

Smart Collaboration - Mitarbeiter-zentriete Informationssysteme in der Produktentstehung

Project: iDev40

Updated at: 29-04-2024

A Research Agenda to Deploy Technology Enhanced Learning with Augmented Reality in Industry

Project: iDev40

Updated at: 29-04-2024

Presentation: The List is Our Process! An analysis of the kernel's email-based development process

Project: iDev40

Updated at: 29-04-2024

Designing Worm-inspired Neural Networks for Interpretable Robotic Control

Project: iDev40

Updated at: 29-04-2024

"Presentation: Quicker from R&D to Line - A ""Smart Experiments"" Approach"

Project: iDev40

Updated at: 29-04-2024

An Empirical Survey of Functions and Configurations of Open-Source Capture the Flag (CTF) Environments

Project: iDev40

Updated at: 29-04-2024

Response Characterization for Auditing Cell Dynamics in Long Short-term Memory Networks

Project: iDev40

Updated at: 29-04-2024

Poster: An experimental proof of the different granularity levels of automated-generated long-term simulation model

Project: iDev40

Updated at: 29-04-2024

A novel Bayesian approach for variable selection in linear regression models

Project: iDev40

Updated at: 29-04-2024

The List is the Process: Reliable Pre-Integration Tracking of Commits on Mailing Lists

Project: iDev40

Updated at: 29-04-2024

Novel challenges for root cause investigation in semiconductor manufacturing

Project: iDev40

Updated at: 29-04-2024

Re-purposing Compact Neuronal Circuit Policies to Govern Reinforcement Learning Tasks

Project: iDev40

Updated at: 29-04-2024

Liquid Time-constant Recurrent Neural Networks as Universal Approximators

Project: iDev40

Updated at: 29-04-2024

Presentation: On the deep nature of human knowledge (part I): Neuroscience, quantum physics and the imaginary

Project: iDev40

Updated at: 29-04-2024

Presentation: On the deep nature of human knowledge (part II): Physical information, knowledge and language

Project: iDev40

Updated at: 29-04-2024

Presentation: New defect classification methodology with regard to causal modeling, supervised by engineers (SME)

Project: iDev40

Updated at: 29-04-2024

A Formally Robust Time Series Distance Metric

Project: iDev40

Updated at: 29-04-2024

A Machine Learning Suite for Machine Components’ Health-Monitoring

Project: iDev40

Updated at: 29-04-2024

Digital Transformation in Semiconductor Manufacturing - Proceedings of the 1st and 2nd European Advances in Digital Tran...

Project: iDev40

Updated at: 29-04-2024

A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facilities

Project: iDev40

Updated at: 29-04-2024

Resources

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Presentation: A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facili...

BEYOND SMART SYSTEMS – CREATING A SOCIETY OF THE FUTURE (5.0) RESOLVING DISRUPTIVE CHANGES AND SOCIAL CHALLENGES

Ontology-Based Model for Automotive Security Verification and Validation

On-Chip Power Stage and Gate Driver for Fast Switching Applications

Presentation: Statistical Modelling and Design for Quality Control and Reliability Analysis in Power Semiconductor Manuf...

Human Work Activity Recognition for Working Cells in Industrial Production Contexts

Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks

Realizing the full potential of Robotic Process Automation through a combination with BPM

Spiking Neural Networks and online learning: an overview and perspectives

SAZED: parameter-free domain-agnostic season length estimation in time series data

Smart Collaboration - Mitarbeiter-zentriete Informationssysteme in der Produktentstehung

A Research Agenda to Deploy Technology Enhanced Learning with Augmented Reality in Industry

Presentation: The List is Our Process! An analysis of the kernel's email-based development process

Designing Worm-inspired Neural Networks for Interpretable Robotic Control

"Presentation: Quicker from R&D to Line - A ""Smart Experiments"" Approach"

An Empirical Survey of Functions and Configurations of Open-Source Capture the Flag (CTF) Environments

Response Characterization for Auditing Cell Dynamics in Long Short-term Memory Networks

Poster: An experimental proof of the different granularity levels of automated-generated long-term simulation model

A novel Bayesian approach for variable selection in linear regression models

The List is the Process: Reliable Pre-Integration Tracking of Commits on Mailing Lists

Novel challenges for root cause investigation in semiconductor manufacturing

Re-purposing Compact Neuronal Circuit Policies to Govern Reinforcement Learning Tasks

Liquid Time-constant Recurrent Neural Networks as Universal Approximators

Presentation: On the deep nature of human knowledge (part I): Neuroscience, quantum physics and the imaginary

Presentation: On the deep nature of human knowledge (part II): Physical information, knowledge and language

Presentation: New defect classification methodology with regard to causal modeling, supervised by engineers (SME)

A Formally Robust Time Series Distance Metric

A Machine Learning Suite for Machine Components’ Health-Monitoring

Digital Transformation in Semiconductor Manufacturing - Proceedings of the 1st and 2nd European Advances in Digital Tran...

A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facilities