EFFRA Innovation Portal

On The Verification of Neural ODEs with Stochastic Guarantees

Project: iDev40

Updated at: 29-04-2024

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Liquid Time-constant Networks

Project: iDev40

Updated at: 29-04-2024

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Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational Inference.

Project: iDev40

Updated at: 29-04-2024

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On Information Plane Analyses of Neural Network Classifiers – A Review

Project: iDev40

Updated at: 29-04-2024

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An Industry 4.0 Production Workplace Enhanced by Using Mixed Reality Assembly Instructions with Microsoft HoloLens

Project: iDev40

Updated at: 29-04-2024

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Cluster Purging: Efficient Outlier Detection based on Rate-Distortion Theory

Project: iDev40

Updated at: 29-04-2024

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Benefits of Digitalization for Business Processes in Semiconductor Manufacturing

Project: iDev40

Updated at: 29-04-2024

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Learning Long-Term Dependencies in Irregularly-Sampled Time Series

Project: iDev40

Updated at: 29-04-2024

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D7.1.3.2 Report on classification algorithms

Project: iDev40

Updated at: 29-04-2024

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Order Release Methods in Semiconductor Manufacturing: State-of-the-Art in Science and Lessons from Industry

Project: iDev40

Updated at: 29-04-2024

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1MHz Gate Driver in Power Technology for Fast Switching Applications

Project: iDev40

Updated at: 29-04-2024

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D7.1.1.1 Report on AES implementation with speed and side-channel immunity improvements

Project: iDev40

Updated at: 29-04-2024

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D4.1.2.1 Concept for digitally augmenting human work

Project: iDev40

Updated at: 29-04-2024

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D6.1.1.1 Press Release: Launching the iDev40 project

Project: iDev40

Updated at: 29-04-2024

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Variable Selection Using Nearest Neighbor Gaussian Processes

Project: iDev40

Updated at: 29-04-2024

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Key Expansion in Cryptographic Systems

Project: iDev40

Updated at: 29-04-2024

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Zur Messung des Einflusses von „Augmented Reality“ auf die individuelle Produktivität bei Montagearbeiten

Project: iDev40

Updated at: 29-04-2024

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Explainable Graph-based Search for Lessons-Learned Documents in the Semiconductor Industry

Project: iDev40

Updated at: 29-04-2024

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D1.3.3.1 Data-driven root cause investigation for variation in semiconductor manufacturing quality (UC1)

Project: iDev40

Updated at: 29-04-2024

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"D2.1.4.1 Context base data provision ""virtual factory"", cyber-physical collaboration (UC7)"

Project: iDev40

Updated at: 29-04-2024

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Transformation of semantic knowledge into simulation-based decision support

Project: iDev40

Updated at: 29-04-2024

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A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification

Project: iDev40

Updated at: 29-04-2024

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Multi-factory Job Shop Scheduling With Due Date Objective

Project: iDev40

Updated at: 29-04-2024

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Streamlining Semiconductor Manufacturing of 200 mm and 300 mm Wafers: A Longitudinal Case Study on the Lot-To-Order-Matc...

Project: iDev40

Updated at: 29-04-2024

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Development and evaluation of a Blockchain concept for the IFD 300 mm Pre-Assembly Line

Project: iDev40

Updated at: 29-04-2024

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HEURISTICS FOR ORDER-LOT PEGGING IN MULTI-FAB SETTINGS

Project: iDev40

Updated at: 29-04-2024

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D4.1.1.4 Enabling a human-centered education, training and knowledge-management system (UC18)

Project: iDev40

Updated at: 29-04-2024

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Ultra-thin oxide breakdown for OTP development in power technologies

Project: iDev40

Updated at: 29-04-2024

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A Comparison of Variational Bounds for the Information Bottleneck Functional

Project: iDev40

Updated at: 29-04-2024

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An unsupervised methodology for online drift detection in multivariate industrial datasets

Project: iDev40

Updated at: 29-04-2024

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Resources

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On The Verification of Neural ODEs with Stochastic Guarantees

Liquid Time-constant Networks

Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational Inference.

On Information Plane Analyses of Neural Network Classifiers – A Review

An Industry 4.0 Production Workplace Enhanced by Using Mixed Reality Assembly Instructions with Microsoft HoloLens

Cluster Purging: Efficient Outlier Detection based on Rate-Distortion Theory

Benefits of Digitalization for Business Processes in Semiconductor Manufacturing

Learning Long-Term Dependencies in Irregularly-Sampled Time Series

D7.1.3.2 Report on classification algorithms

Order Release Methods in Semiconductor Manufacturing: State-of-the-Art in Science and Lessons from Industry

1MHz Gate Driver in Power Technology for Fast Switching Applications

D7.1.1.1 Report on AES implementation with speed and side-channel immunity improvements

D4.1.2.1 Concept for digitally augmenting human work

D6.1.1.1 Press Release: Launching the iDev40 project

Variable Selection Using Nearest Neighbor Gaussian Processes

Key Expansion in Cryptographic Systems

Zur Messung des Einflusses von „Augmented Reality“ auf die individuelle Produktivität bei Montagearbeiten

Explainable Graph-based Search for Lessons-Learned Documents in the Semiconductor Industry

D1.3.3.1 Data-driven root cause investigation for variation in semiconductor manufacturing quality (UC1)

"D2.1.4.1 Context base data provision ""virtual factory"", cyber-physical collaboration (UC7)"

Transformation of semantic knowledge into simulation-based decision support

A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification

Multi-factory Job Shop Scheduling With Due Date Objective

Streamlining Semiconductor Manufacturing of 200 mm and 300 mm Wafers: A Longitudinal Case Study on the Lot-To-Order-Matc...

Development and evaluation of a Blockchain concept for the IFD 300 mm Pre-Assembly Line

HEURISTICS FOR ORDER-LOT PEGGING IN MULTI-FAB SETTINGS

D4.1.1.4 Enabling a human-centered education, training and knowledge-management system (UC18)

Ultra-thin oxide breakdown for OTP development in power technologies

A Comparison of Variational Bounds for the Information Bottleneck Functional

An unsupervised methodology for online drift detection in multivariate industrial datasets