EFFRA Innovation Portal

Electrodeposition of NiSn-rGO Composite Coatings from Deep Eutectic Solvents and Their Physicochemical Characterization

Project: MADEin4

Updated at: 29-04-2024

LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes

Project: MADEin4

Updated at: 29-04-2024

Data fusion by artificial neural network for hybrid metrology development

Project: MADEin4

Updated at: 29-04-2024

Multi-branch neural network for hybrid metrology improvement

Project: MADEin4

Updated at: 29-04-2024

TXRF/GIXRF high precision laboratory setup with high flux monochromatic source

Project: MADEin4

Updated at: 29-04-2024

Inter-diffusion, melting and reaction interplay in Ni/4H-SiC under excimer laser annealing

Project: MADEin4

Updated at: 29-04-2024

Simulations of the Ultra-Fast Kinetics in Ni-Si-C Ternary Systems under Laser Irradiation

Project: MADEin4

Updated at: 29-04-2024

Periodic Reporting for period 3 - MADEin4 (Metrology Advances for Digitized ECS industry 4.0)

Project: MADEin4

Updated at: 29-04-2024

TXRF/GIRXF high precision laboratory setup with high flux monochromatic sources

Project: MADEin4

Updated at: 29-04-2024

MFIG — A Mass Filtered Ion Gauge

Project: MADEin4

Updated at: 29-04-2024

An optical system and image processing tool for predicting PIN malfunctioning in growth Chambers of semiconductors

Project: MADEin4

Updated at: 29-04-2024

Particle detection using closed-loop active model diagnosis

Project: MADEin4

Updated at: 29-04-2024

Closed-loop active object recognition with constrained illumination power

Project: MADEin4

Updated at: 29-04-2024

Predictive virtual processes, metrology and maintenance in power device manufacturing

Project: MADEin4

Updated at: 29-04-2024

High Throughput Scanning Probe Metrology for High-NA EUV photoresist profiling

Project: MADEin4

Updated at: 29-04-2024

Study of plasma etching impact on chemoepitaxy directed self-assembly

Project: MADEin4

Updated at: 29-04-2024

Establishing a sidewall image transfer chemo-epitaxial DSA process using 193 nm immersion lithography

Project: MADEin4

Updated at: 29-04-2024

D6.3.4: SEMICON Europa 2021 Dissemination Factsheets

Project: MADEin4

Updated at: 29-04-2024

Robust Classification of Intramuscular EMG Signals to Aid the Diagnosis of Neuromuscular Disorders

Project: MADEin4

Updated at: 29-04-2024

Structural and electrical characterization of Ni-based ohmic contacts on 4H-SiC formed by solid-state laser annealing

Project: MADEin4

Updated at: 29-04-2024

Phase Retrieval from Overexposed PSF with Projection Methods

Project: MADEin4

Updated at: 29-04-2024

Predictive discarding for sustainable Industry 5.0

Project: MADEin4

Updated at: 29-04-2024

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION IN WORK PIECES

Project: MADEin4

Updated at: 29-04-2024

A Comparative Evaluation of Deep Learning Anomaly Detection Techniques on Semiconductor Multivariate Time Series Data

Project: MADEin4

Updated at: 29-04-2024

Health Indicator for Batch Processes Based on SP-LASSO

Project: MADEin4

Updated at: 29-04-2024

Atomistic Simulation of Ultra-Fast Annealing Processes (Invited Talk)

Project: MADEin4

Updated at: 29-04-2024

Block copolymer line roughness measurement via PSD: application to fingerprint samples

Project: MADEin4

Updated at: 29-04-2024

A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluoresc...

Project: MADEin4

Updated at: 29-04-2024

Convex combination of alternating projection and Douglas–Rachford operators for phase retrieval

Project: MADEin4

Updated at: 29-04-2024

TXRF/GIRXF high precision laboratory setup with high flux monochromatic sources for archeometric applications

Project: MADEin4

Updated at: 29-04-2024

Resources

Selected filters:

Electrodeposition of NiSn-rGO Composite Coatings from Deep Eutectic Solvents and Their Physicochemical Characterization

LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes

Data fusion by artificial neural network for hybrid metrology development

Multi-branch neural network for hybrid metrology improvement

TXRF/GIXRF high precision laboratory setup with high flux monochromatic source

Inter-diffusion, melting and reaction interplay in Ni/4H-SiC under excimer laser annealing

Simulations of the Ultra-Fast Kinetics in Ni-Si-C Ternary Systems under Laser Irradiation

Periodic Reporting for period 3 - MADEin4 (Metrology Advances for Digitized ECS industry 4.0)

TXRF/GIRXF high precision laboratory setup with high flux monochromatic sources

MFIG — A Mass Filtered Ion Gauge

An optical system and image processing tool for predicting PIN malfunctioning in growth Chambers of semiconductors

Particle detection using closed-loop active model diagnosis

Closed-loop active object recognition with constrained illumination power

Predictive virtual processes, metrology and maintenance in power device manufacturing

High Throughput Scanning Probe Metrology for High-NA EUV photoresist profiling

Study of plasma etching impact on chemoepitaxy directed self-assembly

Establishing a sidewall image transfer chemo-epitaxial DSA process using 193 nm immersion lithography

D6.3.4: SEMICON Europa 2021 Dissemination Factsheets

Robust Classification of Intramuscular EMG Signals to Aid the Diagnosis of Neuromuscular Disorders

Structural and electrical characterization of Ni-based ohmic contacts on 4H-SiC formed by solid-state laser annealing

Phase Retrieval from Overexposed PSF with Projection Methods

Predictive discarding for sustainable Industry 5.0

APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION IN WORK PIECES

A Comparative Evaluation of Deep Learning Anomaly Detection Techniques on Semiconductor Multivariate Time Series Data

Health Indicator for Batch Processes Based on SP-LASSO

Atomistic Simulation of Ultra-Fast Annealing Processes (Invited Talk)

Block copolymer line roughness measurement via PSD: application to fingerprint samples

A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluoresc...

Convex combination of alternating projection and Douglas–Rachford operators for phase retrieval

TXRF/GIRXF high precision laboratory setup with high flux monochromatic sources for archeometric applications