EFFRA Innovation Portal

Branch selection and data optimization for selecting machines for processes in semiconductor manufacturing using AI-base...

Project: iDev40

Updated at: 29-04-2024

Correlating electrical and process parameters for yield detractors’ detection

Project: iDev40

Updated at: 29-04-2024

Backward Simulation for Production Planning - Recent Advances in a Real-World Use-Case

Project: iDev40

Updated at: 29-04-2024

Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational Inference.

Project: iDev40

Updated at: 29-04-2024

Order Release Methods in Semiconductor Manufacturing: State-of-the-Art in Science and Lessons from Industry

Project: iDev40

Updated at: 29-04-2024

Learning Long-Term Dependencies in Irregularly-Sampled Time Series

Project: iDev40

Updated at: 29-04-2024

Benefits of Digitalization for Business Processes in Semiconductor Manufacturing

Project: iDev40

Updated at: 29-04-2024

An Industry 4.0 Production Workplace Enhanced by Using Mixed Reality Assembly Instructions with Microsoft HoloLens

Project: iDev40

Updated at: 29-04-2024

1MHz Gate Driver in Power Technology for Fast Switching Applications

Project: iDev40

Updated at: 29-04-2024

Cluster Purging: Efficient Outlier Detection based on Rate-Distortion Theory

Project: iDev40

Updated at: 29-04-2024

On Information Plane Analyses of Neural Network Classifiers – A Review

Project: iDev40

Updated at: 29-04-2024

D4.1.2.1 Concept for digitally augmenting human work

Project: iDev40

Updated at: 29-04-2024

D7.1.1.1 Report on AES implementation with speed and side-channel immunity improvements

Project: iDev40

Updated at: 29-04-2024

D7.1.3.2 Report on classification algorithms

Project: iDev40

Updated at: 29-04-2024

D6.1.1.1 Press Release: Launching the iDev40 project

Project: iDev40

Updated at: 29-04-2024

D1.3.3.1 Data-driven root cause investigation for variation in semiconductor manufacturing quality (UC1)

Project: iDev40

Updated at: 29-04-2024

Zur Messung des Einflusses von „Augmented Reality“ auf die individuelle Produktivität bei Montagearbeiten

Project: iDev40

Updated at: 29-04-2024

Transformation of semantic knowledge into simulation-based decision support

Project: iDev40

Updated at: 29-04-2024

A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification

Project: iDev40

Updated at: 29-04-2024

Multi-factory Job Shop Scheduling With Due Date Objective

Project: iDev40

Updated at: 29-04-2024

Key Expansion in Cryptographic Systems

Project: iDev40

Updated at: 29-04-2024

Variable Selection Using Nearest Neighbor Gaussian Processes

Project: iDev40

Updated at: 29-04-2024

Explainable Graph-based Search for Lessons-Learned Documents in the Semiconductor Industry

Project: iDev40

Updated at: 29-04-2024

"D2.1.4.1 Context base data provision ""virtual factory"", cyber-physical collaboration (UC7)"

Project: iDev40

Updated at: 29-04-2024

Streamlining Semiconductor Manufacturing of 200 mm and 300 mm Wafers: A Longitudinal Case Study on the Lot-To-Order-Matc...

Project: iDev40

Updated at: 29-04-2024

Experimental Analysis of a Stochastic Backward Simulation Approach Under the Specifics of Semiconductor Manufacturing

Project: iDev40

Updated at: 29-04-2024

Development and evaluation of a Blockchain concept for the IFD 300 mm Pre-Assembly Line

Project: iDev40

Updated at: 29-04-2024

D4.1.1.4 Enabling a human-centered education, training and knowledge-management system (UC18)

Project: iDev40

Updated at: 29-04-2024

Ultra-thin oxide breakdown for OTP development in power technologies

Project: iDev40

Updated at: 29-04-2024

A Comparison of Variational Bounds for the Information Bottleneck Functional

Project: iDev40

Updated at: 29-04-2024

Resources

Selected filters:

Branch selection and data optimization for selecting machines for processes in semiconductor manufacturing using AI-base...

Correlating electrical and process parameters for yield detractors’ detection

Backward Simulation for Production Planning - Recent Advances in a Real-World Use-Case

Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational Inference.

Order Release Methods in Semiconductor Manufacturing: State-of-the-Art in Science and Lessons from Industry

Learning Long-Term Dependencies in Irregularly-Sampled Time Series

Benefits of Digitalization for Business Processes in Semiconductor Manufacturing

An Industry 4.0 Production Workplace Enhanced by Using Mixed Reality Assembly Instructions with Microsoft HoloLens

1MHz Gate Driver in Power Technology for Fast Switching Applications

Cluster Purging: Efficient Outlier Detection based on Rate-Distortion Theory

On Information Plane Analyses of Neural Network Classifiers – A Review

D4.1.2.1 Concept for digitally augmenting human work

D7.1.1.1 Report on AES implementation with speed and side-channel immunity improvements

D7.1.3.2 Report on classification algorithms

D6.1.1.1 Press Release: Launching the iDev40 project

D1.3.3.1 Data-driven root cause investigation for variation in semiconductor manufacturing quality (UC1)

Zur Messung des Einflusses von „Augmented Reality“ auf die individuelle Produktivität bei Montagearbeiten

Transformation of semantic knowledge into simulation-based decision support

A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification

Multi-factory Job Shop Scheduling With Due Date Objective

Key Expansion in Cryptographic Systems

Variable Selection Using Nearest Neighbor Gaussian Processes

Explainable Graph-based Search for Lessons-Learned Documents in the Semiconductor Industry

"D2.1.4.1 Context base data provision ""virtual factory"", cyber-physical collaboration (UC7)"

Streamlining Semiconductor Manufacturing of 200 mm and 300 mm Wafers: A Longitudinal Case Study on the Lot-To-Order-Matc...

Experimental Analysis of a Stochastic Backward Simulation Approach Under the Specifics of Semiconductor Manufacturing

Development and evaluation of a Blockchain concept for the IFD 300 mm Pre-Assembly Line

D4.1.1.4 Enabling a human-centered education, training and knowledge-management system (UC18)

Ultra-thin oxide breakdown for OTP development in power technologies

A Comparison of Variational Bounds for the Information Bottleneck Functional