EFFRA Innovation Portal

Flexible, boundary adapted, nonparametric methods for the estimation of univariate piecewise-smooth functions

Project: MADEin4

Updated at: 29-04-2024

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Phase retrieval from overexposed PSF: a projection-based approach

Project: MADEin4

Updated at: 29-04-2024

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Increase of wafer inspection tool throughput with computational imaging

Project: MADEin4

Updated at: 29-04-2024

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D6.3.5: ENBIS 2021 data management / machine learning Workshop Dissemination Factsheet

Project: MADEin4

Updated at: 29-04-2024

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Virtual Metrology to Eliminate Test Wafers Measurements on Copper Electroplating Deposition

Project: MADEin4

Updated at: 29-04-2024

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Wavelet-based robust estimation and variable selection in nonparametric additive models

Project: MADEin4

Updated at: 29-04-2024

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Similarity-based Brownian Motion Approach for Remaining Useful Life Prediction

Project: MADEin4

Updated at: 29-04-2024

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Pulsed Laser Deposition of SWCNTs on Carbon Fibres: Effect of Deposition Temperature

Project: MADEin4

Updated at: 29-04-2024

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Analysis of Line-Edge Roughness Using EUV Scatterometry

Project: MADEin4

Updated at: 29-04-2024

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High-NA EUV photoresist metrology using high-throughput scanning probe microscopy

Project: MADEin4

Updated at: 29-04-2024

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MFIG - a Mass Filtered Ion Gauge

Project: MADEin4

Updated at: 29-04-2024

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High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction

Project: MADEin4

Updated at: 29-04-2024

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Prediction of Yield in semiconductor production from defects optically detected on the Wafers

Project: MADEin4

Updated at: 29-04-2024

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Simulations of the Ultra-Fast Kinetics in Ni-Si-C Ternary Systems under Laser Irradiation

Project: MADEin4

Updated at: 29-04-2024

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Inter-diffusion, melting and reaction interplay in Ni/4H-SiC under excimer laser annealing

Project: MADEin4

Updated at: 29-04-2024

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Periodic Reporting for period 3 - MADEin4 (Metrology Advances for Digitized ECS industry 4.0)

Project: MADEin4

Updated at: 29-04-2024

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TXRF/GIRXF high precision laboratory setup with high flux monochromatic sources

Project: MADEin4

Updated at: 29-04-2024

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TXRF/GIXRF high precision laboratory setup with high flux monochromatic source

Project: MADEin4

Updated at: 29-04-2024

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Closed-Loop Active Model Diagnosis Using Bhattacharyya Coefficient: Application to Automated Visual Inspection.

Project: MADEin4

Updated at: 29-04-2024

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Automatic Defect Detection in Epitaxial Layers by Micro Photoluminescence Imaging

Project: MADEin4

Updated at: 29-04-2024

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LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes

Project: MADEin4

Updated at: 29-04-2024

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Electrodeposition of NiSn-rGO Composite Coatings from Deep Eutectic Solvents and Their Physicochemical Characterization

Project: MADEin4

Updated at: 29-04-2024

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Multi-branch neural network for hybrid metrology improvement

Project: MADEin4

Updated at: 29-04-2024

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Data fusion by artificial neural network for hybrid metrology development

Project: MADEin4

Updated at: 29-04-2024

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MFIG — A Mass Filtered Ion Gauge

Project: MADEin4

Updated at: 29-04-2024

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An optical system and image processing tool for predicting PIN malfunctioning in growth Chambers of semiconductors

Project: MADEin4

Updated at: 29-04-2024

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Structural and electrical characterization of Ni-based ohmic contacts on 4H-SiC formed by solid-state laser annealing

Project: MADEin4

Updated at: 29-04-2024

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Robust Classification of Intramuscular EMG Signals to Aid the Diagnosis of Neuromuscular Disorders

Project: MADEin4

Updated at: 29-04-2024

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Particle detection using closed-loop active model diagnosis

Project: MADEin4

Updated at: 29-04-2024

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Closed-loop active object recognition with constrained illumination power

Project: MADEin4

Updated at: 29-04-2024

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Resources

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Flexible, boundary adapted, nonparametric methods for the estimation of univariate piecewise-smooth functions

Phase retrieval from overexposed PSF: a projection-based approach

Increase of wafer inspection tool throughput with computational imaging

D6.3.5: ENBIS 2021 data management / machine learning Workshop Dissemination Factsheet

Virtual Metrology to Eliminate Test Wafers Measurements on Copper Electroplating Deposition

Wavelet-based robust estimation and variable selection in nonparametric additive models

Similarity-based Brownian Motion Approach for Remaining Useful Life Prediction

Pulsed Laser Deposition of SWCNTs on Carbon Fibres: Effect of Deposition Temperature

Analysis of Line-Edge Roughness Using EUV Scatterometry

High-NA EUV photoresist metrology using high-throughput scanning probe microscopy

MFIG - a Mass Filtered Ion Gauge

High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction

Prediction of Yield in semiconductor production from defects optically detected on the Wafers

Simulations of the Ultra-Fast Kinetics in Ni-Si-C Ternary Systems under Laser Irradiation

Inter-diffusion, melting and reaction interplay in Ni/4H-SiC under excimer laser annealing

Periodic Reporting for period 3 - MADEin4 (Metrology Advances for Digitized ECS industry 4.0)

TXRF/GIRXF high precision laboratory setup with high flux monochromatic sources

TXRF/GIXRF high precision laboratory setup with high flux monochromatic source

Closed-Loop Active Model Diagnosis Using Bhattacharyya Coefficient: Application to Automated Visual Inspection.

Automatic Defect Detection in Epitaxial Layers by Micro Photoluminescence Imaging

LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes

Electrodeposition of NiSn-rGO Composite Coatings from Deep Eutectic Solvents and Their Physicochemical Characterization

Multi-branch neural network for hybrid metrology improvement

Data fusion by artificial neural network for hybrid metrology development

MFIG — A Mass Filtered Ion Gauge

An optical system and image processing tool for predicting PIN malfunctioning in growth Chambers of semiconductors

Structural and electrical characterization of Ni-based ohmic contacts on 4H-SiC formed by solid-state laser annealing

Robust Classification of Intramuscular EMG Signals to Aid the Diagnosis of Neuromuscular Disorders

Particle detection using closed-loop active model diagnosis

Closed-loop active object recognition with constrained illumination power