EFFRA Innovation Portal

Integrated PROPHESY-ML toolkit v2

Project: PROPHESY

Updated at: 29-04-2024

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Visualization and AR Specifciations

Project: PROPHESY

Updated at: 29-04-2024

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Predictive and Explainable Machine Learning for Industrial Internet of Things Applications

Project: PROPHESY

Updated at: 29-04-2024

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Chasing Abnormalities on Time Series for Predictive Maintenance and Advanced Process Control

Project: MADEin4

Updated at: 29-04-2024

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Multiscale simulations of plasma etching in silicon carbide structures

Project: MADEin4

Updated at: 29-04-2024

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Semiconductor Multivariate Time-Series Anomaly Classification Based on Machine Learning Ensemble Techniques

Project: MADEin4

Updated at: 29-04-2024

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Shape- and Element-Sensitive Reconstruction of Periodic Nanostructures with Grazing Incidence X-ray Fluorescence Analysi...

Project: MADEin4

Updated at: 29-04-2024

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Ni-silicide ohmic contacts on 4H-SiC formed by multi pulse excimer laser annealing

Project: MADEin4

Updated at: 29-04-2024

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Combining Approaches of Brownian Motion and Similarity Principle to Improve the Remaining Useful Life Prediction

Project: MADEin4

Updated at: 29-04-2024

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D6.3.6: SEMI Technology Unites Global Summit Dissemination Factsheets

Project: MADEin4

Updated at: 29-04-2024

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Grazing incidence-X-ray fluorescence for a dimensional and elemental characterization of well-ordered nanostructures

Project: MADEin4

Updated at: 29-04-2024

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Multi party privacy preserving machine learning for process control

Project: MADEin4

Updated at: 29-04-2024

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SEMICON Europa 2019 Dissemination Factsheets - 1

Project: MADEin4

Updated at: 29-04-2024

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Industry4.0 Productivity Improvement in Major EU Fabs

Project: MADEin4

Updated at: 29-04-2024

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Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures

Project: MADEin4

Updated at: 29-04-2024

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1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing

Project: MADEin4

Updated at: 29-04-2024

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Ensemble Machine Learning Algorithms for Anomaly Detection in Multivariate Time-Series

Project: MADEin4

Updated at: 29-04-2024

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Uncertainties in the reconstruction of nanostructures in {EUV} scatterometry and grazing incidence small-angle X-ray sca...

Project: MADEin4

Updated at: 29-04-2024

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Modelling Ion Production inside an Electron Impact Ionizer for High-Vacuum Gas Analysis

Project: MADEin4

Updated at: 29-04-2024

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D6.3.3: SEMI Technology Unites Global Summit Dissemination Factsheets

Project: MADEin4

Updated at: 29-04-2024

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A fusion of electronic design, process and metrology in semiconductor manufacturing for improved process optimization an...

Project: MADEin4

Updated at: 29-04-2024

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Surface Topography of Si/TiO2 Stacked Layers on Silicon Substrate Deposited by KrF Excimer Laser Ablation

Project: MADEin4

Updated at: 29-04-2024

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Selective plasma etching of silicon-containing high chi block copolymer for directed self-assembly (DSA) application

Project: MADEin4

Updated at: 29-04-2024

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Projection methods for high numerical aperture phase retrieval

Project: MADEin4

Updated at: 29-04-2024

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SYSTEM AND METHOD FOR INSPECTION AND METROLOGY OF FOUR SIDES OF SEMICONDUCTOR DEVICES

Project: MADEin4

Updated at: 29-04-2024

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COMBINED TRANSMITTED AND REFLECTED LIGHT IMAGING OF INTERNAL CRACKS IN SEMICONDUCTOR DEVICES

Project: MADEin4

Updated at: 29-04-2024

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Predictive discarding of wafers based on power leakage predictions from single layer misalignment data

Project: MADEin4

Updated at: 29-04-2024

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PROLIFIC: A Fast and Robust Profile-Likelihood-Based Muscle Onset Detection in Electromyogram Using Discrete Fibonacci S...

Project: MADEin4

Updated at: 29-04-2024

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Penalised robust estimators for sparse and high-dimensional linear models

Project: MADEin4

Updated at: 29-04-2024

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Penalized wavelet estimation and robust denoising for irregular spaced data

Project: MADEin4

Updated at: 29-04-2024

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Resources

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Integrated PROPHESY-ML toolkit v2

Visualization and AR Specifciations

Predictive and Explainable Machine Learning for Industrial Internet of Things Applications

Chasing Abnormalities on Time Series for Predictive Maintenance and Advanced Process Control

Multiscale simulations of plasma etching in silicon carbide structures

Semiconductor Multivariate Time-Series Anomaly Classification Based on Machine Learning Ensemble Techniques

Shape- and Element-Sensitive Reconstruction of Periodic Nanostructures with Grazing Incidence X-ray Fluorescence Analysi...

Ni-silicide ohmic contacts on 4H-SiC formed by multi pulse excimer laser annealing

Combining Approaches of Brownian Motion and Similarity Principle to Improve the Remaining Useful Life Prediction

D6.3.6: SEMI Technology Unites Global Summit Dissemination Factsheets

Grazing incidence-X-ray fluorescence for a dimensional and elemental characterization of well-ordered nanostructures

Multi party privacy preserving machine learning for process control

SEMICON Europa 2019 Dissemination Factsheets - 1

Industry4.0 Productivity Improvement in Major EU Fabs

Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures

1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing

Ensemble Machine Learning Algorithms for Anomaly Detection in Multivariate Time-Series

Uncertainties in the reconstruction of nanostructures in {EUV} scatterometry and grazing incidence small-angle X-ray sca...

Modelling Ion Production inside an Electron Impact Ionizer for High-Vacuum Gas Analysis

D6.3.3: SEMI Technology Unites Global Summit Dissemination Factsheets

A fusion of electronic design, process and metrology in semiconductor manufacturing for improved process optimization an...

Surface Topography of Si/TiO2 Stacked Layers on Silicon Substrate Deposited by KrF Excimer Laser Ablation

Selective plasma etching of silicon-containing high chi block copolymer for directed self-assembly (DSA) application

Projection methods for high numerical aperture phase retrieval

SYSTEM AND METHOD FOR INSPECTION AND METROLOGY OF FOUR SIDES OF SEMICONDUCTOR DEVICES

COMBINED TRANSMITTED AND REFLECTED LIGHT IMAGING OF INTERNAL CRACKS IN SEMICONDUCTOR DEVICES

Predictive discarding of wafers based on power leakage predictions from single layer misalignment data

PROLIFIC: A Fast and Robust Profile-Likelihood-Based Muscle Onset Detection in Electromyogram Using Discrete Fibonacci S...

Penalised robust estimators for sparse and high-dimensional linear models

Penalized wavelet estimation and robust denoising for irregular spaced data