EFFRA Innovation Portal

Phase retrieval from overexposed PSF: a projection-based approach

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

MFIG - a Mass Filtered Ion Gauge

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

High-NA EUV photoresist metrology using high-throughput scanning probe microscopy

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Wavelet-based robust estimation and variable selection in nonparametric additive models

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Virtual Metrology to Eliminate Test Wafers Measurements on Copper Electroplating Deposition

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Pulsed Laser Deposition of SWCNTs on Carbon Fibres: Effect of Deposition Temperature

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Analysis of Line-Edge Roughness Using EUV Scatterometry

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Similarity-based Brownian Motion Approach for Remaining Useful Life Prediction

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Prediction of Yield in semiconductor production from defects optically detected on the Wafers

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Multi-branch neural network for hybrid metrology improvement

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Data fusion by artificial neural network for hybrid metrology development

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

TXRF/GIRXF high precision laboratory setup with high flux monochromatic sources

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

TXRF/GIXRF high precision laboratory setup with high flux monochromatic source

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Simulations of the Ultra-Fast Kinetics in Ni-Si-C Ternary Systems under Laser Irradiation

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Inter-diffusion, melting and reaction interplay in Ni/4H-SiC under excimer laser annealing

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Periodic Reporting for period 3 - MADEin4 (Metrology Advances for Digitized ECS industry 4.0)

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Closed-Loop Active Model Diagnosis Using Bhattacharyya Coefficient: Application to Automated Visual Inspection.

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Automatic Defect Detection in Epitaxial Layers by Micro Photoluminescence Imaging

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Electrodeposition of NiSn-rGO Composite Coatings from Deep Eutectic Solvents and Their Physicochemical Characterization

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

MFIG — A Mass Filtered Ion Gauge

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

An optical system and image processing tool for predicting PIN malfunctioning in growth Chambers of semiconductors

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Study of plasma etching impact on chemoepitaxy directed self-assembly

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Establishing a sidewall image transfer chemo-epitaxial DSA process using 193 nm immersion lithography

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

D6.3.4: SEMICON Europa 2021 Dissemination Factsheets

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Robust Classification of Intramuscular EMG Signals to Aid the Diagnosis of Neuromuscular Disorders

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Structural and electrical characterization of Ni-based ohmic contacts on 4H-SiC formed by solid-state laser annealing

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Closed-loop active object recognition with constrained illumination power

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Particle detection using closed-loop active model diagnosis

Project: MADEin4

Updated at: 29-04-2024

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Project acronym MADEin4

Resources

Selected filters:

Phase retrieval from overexposed PSF: a projection-based approach

MFIG - a Mass Filtered Ion Gauge

High-NA EUV photoresist metrology using high-throughput scanning probe microscopy

Wavelet-based robust estimation and variable selection in nonparametric additive models

Virtual Metrology to Eliminate Test Wafers Measurements on Copper Electroplating Deposition

Pulsed Laser Deposition of SWCNTs on Carbon Fibres: Effect of Deposition Temperature

Analysis of Line-Edge Roughness Using EUV Scatterometry

Similarity-based Brownian Motion Approach for Remaining Useful Life Prediction

High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction

Prediction of Yield in semiconductor production from defects optically detected on the Wafers

Multi-branch neural network for hybrid metrology improvement

Data fusion by artificial neural network for hybrid metrology development

TXRF/GIRXF high precision laboratory setup with high flux monochromatic sources

TXRF/GIXRF high precision laboratory setup with high flux monochromatic source

Simulations of the Ultra-Fast Kinetics in Ni-Si-C Ternary Systems under Laser Irradiation

Inter-diffusion, melting and reaction interplay in Ni/4H-SiC under excimer laser annealing

Periodic Reporting for period 3 - MADEin4 (Metrology Advances for Digitized ECS industry 4.0)

Closed-Loop Active Model Diagnosis Using Bhattacharyya Coefficient: Application to Automated Visual Inspection.

Automatic Defect Detection in Epitaxial Layers by Micro Photoluminescence Imaging

Electrodeposition of NiSn-rGO Composite Coatings from Deep Eutectic Solvents and Their Physicochemical Characterization

LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes

MFIG — A Mass Filtered Ion Gauge

An optical system and image processing tool for predicting PIN malfunctioning in growth Chambers of semiconductors

Study of plasma etching impact on chemoepitaxy directed self-assembly

Establishing a sidewall image transfer chemo-epitaxial DSA process using 193 nm immersion lithography

D6.3.4: SEMICON Europa 2021 Dissemination Factsheets

Robust Classification of Intramuscular EMG Signals to Aid the Diagnosis of Neuromuscular Disorders

Structural and electrical characterization of Ni-based ohmic contacts on 4H-SiC formed by solid-state laser annealing

Closed-loop active object recognition with constrained illumination power

Particle detection using closed-loop active model diagnosis