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Projects
MADEin4
Report - Video - Presentation - Publication....?
MADEin4
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Mapped projects (231)
Mapped results (7436)
Video
Presentation
Report
Results:
D6.3.3: SEMI Technology Unites Global Summit Dissemination Factsheets
SEMICON Europa 2019 Dissemination Factsheets - 1
D6.3.4: SEMICON Europa 2021 Dissemination Factsheets
D6.3.5: ENBIS 2021 data management / machine learning Workshop Dissemination Factsheet
D6.3.6: SEMI Technology Unites Global Summit Dissemination Factsheets
Publication
Results:
TXRF/GIRXF high precision laboratory setup with high flux monochromatic sources for archeometric applications
A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence
Convex combination of alternating projection and Douglas–Rachford operators for phase retrieval
Robust Classification of Intramuscular EMG Signals to Aid the Diagnosis of Neuromuscular Disorders
Structural and electrical characterization of Ni-based ohmic contacts on 4H-SiC formed by solid-state laser annealing
TXRF/GIXRF high precision laboratory setup with high flux monochromatic source
TXRF/GIRXF high precision laboratory setup with high flux monochromatic sources
Inter-diffusion, melting and reaction interplay in Ni/4H-SiC under excimer laser annealing
Simulations of the Ultra-Fast Kinetics in Ni-Si-C Ternary Systems under Laser Irradiation
Wavelet-based robust estimation and variable selection in nonparametric additive models
Virtual Metrology to Eliminate Test Wafers Measurements on Copper Electroplating Deposition
Flexible, boundary adapted, nonparametric methods for the estimation of univariate piecewise-smooth functions
Penalized wavelet estimation and robust denoising for irregular spaced data
PROLIFIC: A Fast and Robust Profile-Likelihood-Based Muscle Onset Detection in Electromyogram Using Discrete Fibonacci Search
Predictive discarding of wafers based on power leakage predictions from single layer misalignment data
Penalised robust estimators for sparse and high-dimensional linear models
Modelling Ion Production inside an Electron Impact Ionizer for High-Vacuum Gas Analysis
Grazing incidence-X-ray fluorescence for a dimensional and elemental characterization of well-ordered nanostructures
Multi party privacy preserving machine learning for process control
Chasing Abnormalities on Time Series for Predictive Maintenance and Advanced Process Control
Multiscale simulations of plasma etching in silicon carbide structures
Closed-loop active object recognition with constrained illumination power
Particle detection using closed-loop active model diagnosis
Closed-Loop Active Model Diagnosis Using Bhattacharyya Coefficient: Application to Automated Visual Inspection.
Increase of wafer inspection tool throughput with computational imaging
Phase retrieval from overexposed PSF: a projection-based approach
Projection methods for high numerical aperture phase retrieval
Predictive virtual processes, metrology and maintenance in power device manufacturing
Automatic Defect Detection in Epitaxial Layers by Micro Photoluminescence Imaging
A fusion of electronic design, process and metrology in semiconductor manufacturing for improved process optimization and control
Industry4.0 Productivity Improvement in Major EU Fabs
Ni-silicide ohmic contacts on 4H-SiC formed by multi pulse excimer laser annealing
A Comparative Evaluation of Deep Learning Anomaly Detection Techniques on Semiconductor Multivariate Time Series Data
High Throughput Scanning Probe Metrology for High-NA EUV photoresist profiling
Atomistic Simulation of Ultra-Fast Annealing Processes (Invited Talk)
Health Indicator for Batch Processes Based on SP-LASSO
Electrodeposition of NiSn-rGO Composite Coatings from Deep Eutectic Solvents and Their Physicochemical Characterization
LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes
Similarity-based Brownian Motion Approach for Remaining Useful Life Prediction
Pulsed Laser Deposition of SWCNTs on Carbon Fibres: Effect of Deposition Temperature
Analysis of Line-Edge Roughness Using EUV Scatterometry
Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures
Ensemble Machine Learning Algorithms for Anomaly Detection in Multivariate Time-Series
1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing
Semiconductor Multivariate Time-Series Anomaly Classification Based on Machine Learning Ensemble Techniques
Combining Approaches of Brownian Motion and Similarity Principle to Improve the Remaining Useful Life Prediction
Surface Topography of Si/TiO2 Stacked Layers on Silicon Substrate Deposited by KrF Excimer Laser Ablation
Uncertainties in the reconstruction of nanostructures in {EUV} scatterometry and grazing incidence small-angle X-ray scattering
Shape- and Element-Sensitive Reconstruction of Periodic Nanostructures with Grazing Incidence X-ray Fluorescence Analysis and Machine Learning.
MFIG - a Mass Filtered Ion Gauge
High-NA EUV photoresist metrology using high-throughput scanning probe microscopy
Block copolymer line roughness measurement via PSD: application to fingerprint samples
Establishing a sidewall image transfer chemo-epitaxial DSA process using 193 nm immersion lithography
Study of plasma etching impact on chemoepitaxy directed self-assembly
Data fusion by artificial neural network for hybrid metrology development
Multi-branch neural network for hybrid metrology improvement
Selective plasma etching of silicon-containing high chi block copolymer for directed self-assembly (DSA) application
Open Research Data Pilot
Other medium